Interpreting Yield Variability with Electrical Conductivity and Terrain Attributes across a Central Kentucky Landscape
B. G. Sears, B. Mijatovic, T. G. Mueller, and R. I. Barnhisel
September 2005
Review
Interpretation of yield maps for management requires an adequate understanding of the factors that influence the variability of crop productivity. The objective of this study was to investigate the use of precision agriculture technologies for interpreting corn grain yield variability across a Central Kentucky landscape.
doi:10.1094/CM-2005-0928-01-RV
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